- Arises from both models.
- Energy gap increases with Vo.
- Position of Ef is determined by the number of valence electrons per unit cell.
Insulators (Large energy gap,
Ef inside it, no Fermi surface)
Semiconductors: small energy gap,
Ef inside it, no Fermi surface
Metals: Ef is inside energy band
Nota:
Away from edge, FEM holds
Brillouin zones
Nota:
A BZ contains a set of wavevectors which spans the space of all wavevectors which can be scattered by the crystal.
All wave vectors in other BZ's satisfy k'=k+G (Laue's condition), where G is a reciprocal lattice vector.
Different BZ's correspond
to different energy bands
Nota:
Energy gaps
coincide with BZ
boundaries
(surfaces)
Energy bands lie in
different BZs
3 Zone schemes
Extended
Periodic
Reduced
Nota:
As an electron jumps from the valence band to the conduction band, a positively charged hole is left.
Same properties as electron but positively charged!
Density of charge carriers in semiconductors
(IMPORTANT DERIVATION!
Density of states (TO REMEMBER)
Occupation number
(FD distribution) (TO REMEMBER)
Nota:
Remember to approximate with simple exponential as the exponential in the denominator becomes >> 1
Of electrons f_FD
Of holes: 1-f_FD
(remember to rearrange)
Change variable and integrate to get Number
of charge carriers + multiply by 2 for spin
K and Real space diagrams for
charge carrier densities
Electrons are in conduction band minima
Holes are in valence band maxima
Product of n and p only
depends on energy gap E_g.
For intrinsic semiconductors
n=p=n_i=p_i
Nota:
e.g. Ge, Si, GaAs
n=p=n_i=p_i=sqrt(np)
are fully specified by E_g
Extrinsic semiconductors. Dopants:
donors have valence >; acceptors have
valence < (donate holes)
Have extrinsic carriers from dopants
Usually dopant density >> intrinsic density =>
dopants dominate conduction properties at normal T's
At low T: extrinsic carriers are frozen out,
Intrinsic carriers dominate
In saturation region (T about 300K): dopants are
fully ionised and dominate conduction properties.
This is the operating range of the device.
At T>>300K semiconductor ionises and intrinsic carriers dominate
Insulators have no dopants
n = N_c*e^((E_c-E_f)/k_b*T)
dn/dx = -(dE_c/dx)*n/k_b*T
Holes: empty states in
otherwise filled bands
Bloch States: - 2 separate
bands for conduction and
valence. - Use m*
Derivation of m*
FEM: - dispersion relation is
a parabola on which states lie.
- Use m
Conduction in semiconductors
In FEM
Filled states form a
Fermi sphere in k-space
Nota:
Radius k_f of the sphere was derived in Part 1 of the course.
k is related linearly to momentum
and velocity of electrons
For each electron going in +k there is
one in -k => no net current
Apply E field
Use De Broglie relation to express
dk = (-eE/h_bar)dt
Now electrons are shifting to higher k values
=> Fermi sphere is moving => current
Scattering slows down the increase in velocity
of Fermi sphere by knocking electrons back to
empty states in the valence band
Nota:
Electrons at the leading edge (in the Fermi sphere, k.-space) are scattered back to the opposite edge.
Given a scattering time t, dk/dt settles down at -(eE/h_bar)t
=> Steady State
Drift velocity: v_drift = (eE/m)t
of all electrons in the sphere
Nota:
where et/m = u (carrier mobility)
Energy of level E_c = -eV + const. Moreover: E_field = -dV/dx
Hence, dE_c/dx = -edV/dx = e*E_field
dn/dx = -e*E_field*n/k_b*T
Einstein's relation: D_n/u_n = k_b*T/e
In real solids same thing except that
m* instead of m and have + sign for holes
Charge transport occurs separately in
the valence and in the conduction band
Collisions can knock electrons to other
band or other state in the same band
Different sources of scattering
Nota:
Temperature dependent:
- Scattering from acoustic and optical phonons, dominates at high temperatures.
- Scattering from ionised donor centres. Important for devices.
Temperature independent:
- Scattering from crystal defects, dominates at low temperatures.
T dependent: phonons, ionised dopant centres
T independent: crystal defects
Charge carrier mobility: defined as
ratio of drift velocity to applied E
Can also be expressed as u = et/m* (careful
with sign for different charge carriers!)
Drift: charge flow due to E field
Nota:
Note: holes move in same direction as current, electrons in opposite.
Drift current density: Jn = qnv = enuE (for e's)
and Jp = qpv = qpu_pE (for holes)
Total drift current density is given by the sum
J_drift = Jn + Jp = e(qpu_p + qnu_e)E
Define conductivity sigma = e(qpu_p + qnu_e)
such that J = sigma E
Nota:
Ohm's Law
Total current is sum of drift and diffusion currents
J_n = e*n(x)*u_n*E_field + e*D_n*dn/dx
Nota:
Note: total current J must be costant (in most cases) everywhere according to Kirchoff's laws.
In equilibrium: Jn and Jp are both equal to 0
=> e*n(x)*u_n*E_field = - e*D_n*dn/dx
Diffusion: proportional to gradient of carrier concentration:
phi_n(x) = -D_n dn/dx || Phi_p(x) = D_p dp/dx
If δn charge carriers are injected in region of opposite type:
δn(x) = Δ n exp( − x L n )
Generation and recombination of elctron-hole pairs
At equilibrium: the two occur at the same rate
Non equilibrium: minority carriers, electrically or optically created,
recombine with some majority carriers. The recombination time is
inversely proportional to the number of majority carriers.
Number of excess minority carriers decays exponentially
in time at a rate equal corresponding to recombination time "tau".
Diffusion Length: how long charge carriers propagate before
they recombine. L_n = sqrt(D_n*tau_n). The number of excess
carriers decays exponentially at a decay length L_n
pn-junction formation: take n and p-type and
place them next to each other
Nota:
Lecture 19
Diffusion causes majority carriers to move
from both sides to the opposite side
A net charge density of opposite sign remains on each side
in the depletion region => Efield is generated across junction
Approximate charge density as constant
on each side of depletion region
Nota:
i.e. graph charge vs displacement is a rectangle on each side. rho = e*N_D
When diffusion and drift balance => Equilibrium
=> E_f is constant everywhere
Use Gauss's Law to work out field in the depletion region
Nota:
Integrate in p (-x to 0) and n (0 to x) regions separately. At interface take E = E_0. Express E_0 in terms of boundary conidtions at edges taeking and E = 0 at the edges (x_n and x_p).
Integrate E field to get the potential
Use boundary conditions V(x_n) = V_0 and V(x_p) = 0 to
work out V in p and n (up to constant V_0) regions
Impose continuity of V at boundary to express V_0 as function of x_p and x_n
Use relations for x_p and x_n to express V_0 as a
function of the width of the depletion region
E_v= -eV and E_c = E_v + E_g
Obtain expression for relative width of p and n region in
terms of carrier concentrations from continuity of >E at
interface
Rearrange to get x_p and x_n in terms of width
W and carrier concentrations
Operational behaviour of pn-junctions.
Can bias this voltage in 4 ways
Nota:
Lecture 20
Reverse bias -V: step
increases, W increases
Zero bias. E_f is constant
Forward bias +V: step decreases, W decreases
the two E_f's are separated by eV
Flat band V=V_0: step is 0, W=0,
difference between E_f's is eV_0.
Proof of Shockley's Ideal Diode Equation
Nota:
to follow
Calculate excess minority carriers Δp_n from difference
between p_n and p_n(x_n) (same for n)
Nota:
for p_n, use fermi level of n region. for p_n(x_n), use fermi level of p region.
Δp_n = p_n *(exp(ev/kT)-1)
Consider diffusion of minority carriers δp_n(X)=Δp_n*exp(-X/L_p) ,
Nota:
X = x-x_n
Hence diffusion current J_diff = e*D_p/L_p*Δp_n*exp(-X/L_p)
Set X = 0, so no recombination takes place. Considering both p and
n diffusion currents and multiplying by area.
Shockley's Equation for ideal diodes: I =
e*A*[D_p/L_p*p_n +
D_n/L_n*n_p]*(exp(eV/kT) -1)
Nota:
Fails for voltages above flat band. Neglects recombination within depletion region.
Devices
Forward bias
Diode (one-way current gate)
LED: recombination generates photons
Zero-bias
Photovoltaic-cells: photon absorption
generates carriers which create voltage
Reverse-bias
Photodiodes: light absorbed generate
carriers which generate current
Absorption and emission in semiconductors
TO CLARIFY: ABSORPTION COEFF'S ETC.
Horizontal transition (big shift in k)
Non-radiative: phonons
Phonons carry a lot of momentum, but little energy
Vertical transition (energy band jump)
Radiative: photon
Photons carry little momentum
but a lot of energy
Non-radiative: multiphonons (large change in k)
Requires hole and electrons with same k
Nota:
Hole and electrons have same k, so that direct transition is possible
For direct gap semiconductors
this occurs directly
Direct gap s.c. suitable for optical purposes
Emission occurs at E_g
Absorption only occurs at energies >= E_g, hence lower energies get
through and show colour of material, while higher energies are absorbed.
For indirect gap semiconductors requires previous
horizontal transition: extremely unlikely
Indirect gap s.c. not suitable for optical purposes