7116845
Beschreibung
Karteikarten von Nazmin Shafiq, aktualisiert more than 1 year ago
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Erstellt von Nazmin Shafiq
vor etwa 8 Jahre
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| Frage | Antworten |
| Resolution | Ability to differentiate between 2 close objects |
| Magnification | How big an image is compared to the object |
| Equation for magnification | |
| Decribe optical microscope | Light focused by lens Light passed through specimen More light absorbed = darker Mag = Eyepiece x Objective lens |
| Advantages of optical microscope | Cheap Easy to use True colour (may req staining) |
| Limits of optical microscope | Low resolution (0.2um) Low magnification (1500x) |
| Decribe SEMs | Directs beam of e- across specimen Image based on e- reflected ( Knocks of e- from spec Gather in cathode ray tube form image on comp ) ADDITIONAL |
| Advantages of SEMs | High resolution (200,000x) Surface structure 3D High magnification (2nm) Thick spec |
| Limits of SEMs | Lower resolution than TEM Dead spec Expensive Training B&W / False colour |
| Decribe Transmission Electron Microscope | Use electomagnets to focus beam on e- transmitted through spec image based on e- absorbed Denser spec = more e- absorp = darker |
| Advantages of TEMs | High resolution (2nm) images on internal structures High magnification (500,000x) |
| Limits of TEMs | Thin spec Dead spec Expensive Training B&W / False colour |
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